Les abréviations fréquemment utilisées en optique à rayons X et en synchrotrons sont présentées ici par ordre alphabétique.
| Abréviation | Définition | Catégorie |
| 3D | three dimensional | term |
| ACA | American Crystallographic Association | institution |
| ACF | AutoCorrellation Function | term |
| ACI | Absorption Contrast Imaging | term |
| ADRESS | SLS beamline for "ADvanced RESonant Spectroscopies" (at X03MA") | beamline |
| AFL | Adiabatically Focusing Lens | device |
| AFM | Atomic Force Microscopy | method |
| AIST | National Institute of Advanced Industrial Science and Technology | institution |
| ALBA | "ALBA" Synchrotron Light Facilty (formerly Laboratorio de Luz Sincrotrón), Vallés, Spain | synchrotron |
| ALD | Atomic Layer Deposition | method |
| ALICE | Accelerators and Lasers In Combined Experiments | institution |
| ALS | Advanced Light Source, Berkeley, CA | synchrotron |
| ANKA | Ångströmquelle Karlsruhe | synchrotron |
| AOFSRR | Asia-Oceania Forum for Synchrotron Radiation Research | Konferenz |
| APD | Avalanche Photodiode | device |
| APS | Advanced Photon Source, Argonne, Illinois | synchrotron |
| ARJ | American Journal of Roentgenology | Zeitschrift |
| ARRS | American Roentgen Ray Society | institution |
| AS | Australian Synchrotron, Melbourne, Victoria | synchrotron |
| ASAXS | Anomalous Small Angle X-ray Scattering | method |
| ASCA | Advanced Satellite for Cosmology and Astrophysics | device |
| ASM | All-Sky Monitor | device |
| ASTRID | Institute for Storage Ring Facilities, Aarhus, Denmark | synchrotron |
| AXAF | Advanced X-ray Astrophysical Facility | institution |
| AXAF-I | Imaging Advanced X-ray Astrophysical Facility | institution |
| AXAF-S | Spectroscopy Advanced X-ray Astrophysical Facility | institution |
| BAMline | BESSY beamline (= "ID-02-1") | beamline |
| BAT | Burst (gamma ray) alert telescope | device |
| BBCO | Backscattering Bragg Crystal Optics | device |
| BBXRT | Broad Band X-ray Telescope | device |
| BCDI | Bragg X-ray Coherent Diffraction Imaging | method |
| BCO | Bragg Crystal Optics | device |
| BCRL | Bubble Compound Refractive Lens | device |
| BESSY | Berliner Elektronenspeicherring-Gesellschaft für Synchrotronstrahlung m.b.H. | synchrotron |
| BFML | Bragg Fresnel Multilayer Lenses | device |
| BFO | Bragg Fresnel Optics | device |
| BL | Beamline | device |
| BLCA | Bent Laue Crystal Analyse | method |
| BM | Bending Magnet | device |
| BPM | Beam Position Monitoring | method |
| BSRF | Beijing Synchrotron Radiation Facility, Beijing | synchrotron |
| CA | Clear Aperture | term |
| CAMD | Center for Advanced Microstructures and Devices, Baton Rouge, Louisiana | synchrotron |
| CANDLE | Center for the Advancement of Natural Discoveries using Light Emission | synchrotron |
| CARL | Compound Array Refractive Lens | device |
| CAT | Computerized Axial Tomography | method |
| CCD | Charge-Coupled Device | device |
| CDI | Coherent Diffractive Imaging | method |
| CELLS | Consortium for the Exploitation of the Synchrotron Light Laboratory at ALBA | institution |
| CESR | Cornell Electron-Positron Storage Ring | synchrotron |
| CGRI | Center for Gamma-Ray Imaging an der Universität von Arizona | institution |
| CHESS | Cornell High Energy Synchrotron Source, Ithaca, New York | synchrotron |
| CHX | Coherent Hard X-ray Scattering | beamline |
| CIRCE | ALBA beamline for photoemission spectroscopy and microscopy | beamline |
| CLESSIDRA | = "hour glass" in Italian; mosaic type refractive X-ray lens developed at ELETTRA | device |
| CLS | Canadian Light Source (CLS), Saskatoon, Saskatchewan | synchrotron |
| CMOS | Complementary Metal Oxide Semiconductor | device |
| Con-X | Constellation-X Mission (NASA X-ray telescope project now called NASA IXO) | device |
| CPRXL | Compound Parabolic Refractive X-ray Lenses | device |
| CPU | Circularly Polarizing Undulator | device |
| CRL | Compound Refractive Lens | device |
| CRT | Cathode Ray Tube | device |
| CS | Central Stop | device |
| cSAXS | SLS beamline for coherent small-angle x-ray scattering (at "X12SA") | beamline |
| CSX | Coherent Soft X-ray Scattering and polarization | beamline |
| CT | Computed Tomography | method |
| CTF | Contrast Transfer Function | term |
| CuZP | Cubic Zone Plate | device |
| CVD | Chemical Vapour Deposition | method |
| CXD | Coherent X-ray Diffraction | method |
| CXDI | Coherent X-ray Diffraction Imaging | method |
| CXO | Chandra X-ray Observatory | device |
| CXRL | Center for X-ray Lithography, Univ. of Wisconsin, Stoughton, WI, USA | institution |
| CXRO | Center for X-ray Optics at Berkeley, CA | institution |
| CXS | ARC Center of Excellence for Coherent X-ray Science, Victoria, Australia | institution |
| CXS | Coherent X-ray Scattering | method |
| CZP | Cubic Zone Plate | device |
| D-MOSTAB | Control unit for stabilizing the monochromators (at synchrotron sources) | device |
| DAC | Diamond Anvil Cell | device |
| DAFS | Diffraction Anomalous Fine Structure | method |
| DAXM | Differential Aperture X-ray Microscope | device |
| DCE | Data Collection Efficiency | term |
| DCM | Double-Crystal Monochromator | device |
| DCT | Diffraction Contrast Tomography | method |
| DEI | Diffraction Enhanced Imaging | method |
| DELTA | Dortmund Electron Test Accelerator, Dortmund, Germany | synchrotron |
| DESY | Deutsches Elektronen Synchrotron, Hamburg, Germany | synchrotron |
| DFELL | Duke University Free Electron Laser Laboratory | synchrotron |
| DFI | Dark Field Illumination | method |
| DGK | Deutsche Gesellschaft für Kristallographie | institution |
| DIAMOND | British National Synchrotron at Rutherford Appleton Laboratory, Didcot, GB | synchrotron |
| DLS | Dynamic Light Scattering | method |
| DMM | Double Multilayer Monochromator | device |
| DOE | Diffractive Optical Element | device |
| DOF | Depth Of Field | term |
| DORIS | storage ring at DESY | synchrotron |
| DPC | Differential Phase Contrast | term |
| DPHM | Double-Prism Holographic Microscopy | method |
| DQE | Detective Quantum Efficiency | term |
| DSC | Differential Scanning Calorimetry | method |
| DSP | Digital signal processor | device |
| DW | Damping Wiggler | device |
| DXRL | Deep X-Ray Lithography | method |
| DXT | Diffracted X-ray Tracking | method |
| EBCT | Electron Beam Tomography | method |
| EBL | Electron Beam Lithography | method |
| EBS | Extremely Brilliant Source | device |
| ECR | European Congress of Radiology | Konferenz |
| EDX | Energy-Dispersive X-ray Spectroscopy | method |
| EELS | Electron Energy Loss Spectroscopy | method |
| EEM | Elastic Emission Machining | method |
| EF-PEEM | Energy Filtered Photoelectron Emission Spectroscopy | method |
| ELETTRA | Elettra Synchrotron Light Source, Trieste, Italy | synchrotron |
| ELISA | European LIght Sources Activities | institution |
| ELSA | Electron Stretcher Accelerator, Bonn, Germany | synchrotron |
| EMRS | European Materials Research Society | institution |
| EPFL | Ecole Polytechnique Fédérale de Lausanne | institution |
| EPU | Elliptically Polarizing Undulator | device |
| EPW | Elliptically Polarizing Wiggler | device |
| ERL | Energy Recovery Linac | device |
| ESA | European Space Agency | institution |
| ESAC | European Space Astronomy Centre | institution |
| ESF | Edge Spread Function | term |
| ESRF | European Synchrotron Radiation Facility | synchrotron |
| ESUO | European Synchrotron Users Organisation | institution |
| ETSF | European Theoretical Spectroscopy Facility | institution |
| EUV | Extreme Ultraviolet | term |
| EXAFS | Extended X-ray Absorption Fine Structure | method |
| EXOSAT | European Space Agency's X-ray Observatory | device |
| FCDI | Fresnel Coherent Diffractive Imaging | method |
| FDI | Fresnel Diffraction Imaging | method |
| FE | Front End (of a beam line) | device |
| FEA | Finite Element Analysis | method |
| FEL | Free Electron Laser | device |
| FFDXM | Full Field Diffraction X-ray Microscopy | method |
| FFT | Fast Fourier Transformation | term |
| FF-TXM | Full Field Transmission X-ray Microscopy | method |
| FIB | Focused Ion Beam | device |
| FLASH | FEL at DESY, Hamburg, Germany | synchrotron |
| FOV | Field Of View | term |
| FPM | Fourier ptychographic microscopy | method |
| FR CCD | Fast Readout CCD | device |
| FRET | Fluorescence (or Förster) Resonance Energy Transfer | method |
| FS | Fermi Surface | term |
| FSGM | Focusing Spherical Grating Monochromator | device |
| FTH | Fourier Transform Holography | method |
| FTH | Fourier Transformation | term |
| FWHM | Full Width at Half Maximum | term |
| FZP | Fresnel Zone Plate | device |
| GADDS | General Area Detector Diffraction System | device |
| GBI | Grating Based Imaging | method |
| GDS | Ground State Depletion | method |
| GEM | Gas Electron Multiplier | device |
| GEXRF | Grazing-Emission X-Ray Fluorescence | method |
| GISAS | Grazing Incidence Small-Angle Scattering | method |
| GISAXS | Grazing Incidence Small Angle X-ray Scattering | method |
| GIWAXS | Grazing Incidence Wide-Angle X-ray Scattering | method |
| GIXRD | Grazing Incidence X-ray Diffraction | method |
| GM | Göbel Mirror | device |
| GRB | Gamma Ray Burst | term |
| GTSAXS | Grazing-Transmission Small Angle X-ray Scattering | method |
| Gy | Gray, a unit for measuring radiation | term |
| HASYLAB | Hamburger Synchrotronstrahlungslabor at DESY, Hamburg, Germany | synchrotron |
| HEA | High Energy Astronomy | term |
| HEMS | High Energy Materials Science Beamline | device |
| HEXITEC | HEXITEC consortium (High Energy X-ray Imaging Technology) | method |
| HFSR | High Spatial Frequency (of e.g. a mirror surface; measured over a length of 1 nm to 1 µm) | term |
| HHG | High Harmonic Generation | term |
| HHL | High Heat Load | term |
| HIM | Helium Ion Microscope | device |
| HiSOR | Hiroshima Synchrotron Radiation Center | synchrotron |
| HOPG | Highly Oriented Pyrolitic Graphite | device |
| HRXRD | High Resolution X-ray Diffraction | method |
| HSFR | High Spatial Frequency Roughness | term |
| HSRC | Hiroshima Synchrotron Radiation Center | synchrotron |
| HTRS | High Time Resolution Spectrometer | device |
| HXD | Hard X-ray Detector | device |
| HXN | Hard X-ray Nanoprobe | beamline |
| HXT | Hard X-ray Telescope | device |
| IAEA | International Atomic Energy Agency | institution |
| IBL | Imaging Beamline | device |
| ICNX | International Conference on Neutron and X-ray scattering | Konferenz |
| ICRP | International Commission on Radiological Protection | institution |
| ID | Insertion Device | device |
| ID22 | ESRF high resolution powder diffraction beamline | beamline |
| IDH | Internal Detector Holography | method |
| IGCT | Inverse Geometry Computer Tomography | method |
| IM | Intermediate Mask (in the LIGA-process) | device |
| IMRT | Intensity Modulated Radiation Therapy | method |
| IMT | Institute for Microstructure Technology | institution |
| INDUS-1+2 | Center for Advanced Technology, Indore, India | synchrotron |
| IPAC | International Program and Advisory Board | institution |
| IR | SLS beamline for infrared spectroscopy (at "X01DC") | beamline |
| IRPS | International Radiation Physics Society | institution |
| ISA | Institute for Storage Ring Facilities, Aarhus, Denmark | synchrotron |
| ISH | Internal Source Holography | method |
| IUCr | International Union of Crystallography | institution |
| IVPMU | In-Vacuum Permanent Magnet Undulator | device |
| IVU | In-Vacuum Undulator | device |
| IXO | International X-ray Observatory | device |
| IXS | Inelastic X-ray Scattering | method |
| IXS | Inelastic X-ray Scattering | beamline |
| JAXA | Japanese Aerospace Exploration Agency | institution |
| JSSRR | Japanese Society for Synchrotron Radiation Research | institution |
| KBM | Kirkpatrick-Baez Mirror | device |
| KDI | Keyhole Diffraction Imaging | method |
| KFS | Komitee "Forschung mit Synchrotronstrahlung" | institution |
| KTH | Royal Institute of Technology, Stockholm, Sweden | institution |
| LCLS | Linac Coherent Light Source (FEL) | synchrotron |
| LCS | Laser-Compton-Scattering (X-ray facility) | method |
| LECBD | Low-Energy Cluster Beam Deposition | method |
| LEO | Lobster Eye Optics | device |
| LEO | Low Earth Orbit | term |
| LEPECVD | Low Energy Plasma Enhanced Chemical Vapour Deposition | method |
| LEXRF | Low Energy X-ray Fluorescence | method |
| LID | Long Insertion Device | device |
| LIGA | Lithographie, Galvanoformung und Abformung (= micro structuring process including: lithography, electroplating and molding) | method |
| Linac | Linear Particle Accelerator | device |
| LNLS | Laboratório Nacional de Luz Síncrotron, Sao Paolo, Brazil | synchrotron |
| LPP | Laser Puls Plasma (Soft X-ray source) | device |
| LSF | Line Spread Function | term |
| LSFR | Low Spatial Frequency Roughness | term |
| LSO | Lutetiumoxyorthosilicat | device |
| LTP | Long Trace Profiler | device |
| LURE | Laboratoire pour l'Utilisation du Rayonnement Electromagnétique, Orsay, France | synchrotron |
| MAD | Multiwavelength Anomalous Diffraction | method |
| MARS | Soleil beamline for Multi-Analyses on Radioactive Samples | beamline |
| MAX IV | MAX IV, Lund, Sweden | synchrotron |
| MBE | Molecular Beam Epitaxy | method |
| MCP | Micro Channel Plate | device |
| MDCT | Multidetector Computed Tomography | method |
| MEMS | Micro-Electro-Mechanical System | term |
| MEXH | Multiple Energy X-ray Holography | method |
| MFO | Multi Foil Optics | device |
| Micromegas | Micro-Mesh Gaseous Structure detector | device |
| MicroXAS | SLS beamline for XAS and XRF with high spatial resolution | beamline |
| MISTRAL | ALBA beamline for X-ray microscopy (= "XM") | beamline |
| MLL | Multilayer Laue Lens | device |
| MLM | Multi Layer Mirror | device |
| MNA | Malaysian Nuclear Agency | institution |
| MOA | Microstructured Optical Array | device |
| MOEMS | Micro-Opto-Electro-Mechanical System | term |
| MOKE | Magneto-Optical Kerr Effect | term |
| MOSTAB | Control unit for stabilizing the monochromators (at a synchrotron source) | device |
| MPG | Max-Planck-Gesellschaft | institution |
| MPGD | Micro Pattern Gaseous Detector | device |
| MPI | Max-Planck-Institut | institution |
| MPL | Multi-Prism X-ray Lens | device |
| MPO | Micro Pore Optics | device |
| MS | SLS beamline for material science (at "X04SA") | beamline |
| MSD | Magnetron Sputter Deposition | method |
| MSFR | Mid Spatial Frequency Roughness | term |
| MSPD | ALBA beamline for Materials Science and Powder Diffraction | beamline |
| MTF | Modulation Transfer Function | term |
| MuCLS | Munich Compact Light Source | device |
| MURA | Modified Uniformly Redundant Array | term |
| NASA | National American Space Agency | institution |
| NCD | ALBA beamline for Non Crystalline Diffraction (= "NCD - Port 11") | beamline |
| NCXT | The National Center for X-ray Tomography | institution |
| NewSUBARU | Synchrotron of the University of Hyogo, Japan | synchrotron |
| NEXAFS | Near-edge X-ray Absorption Fine Structure (Spectroscopy) | method |
| NFL | Nanofocusing Refractive X-ray Lens | device |
| NIMS | National Institute for Materials Science (X-Ray Physics Group), University of Tsukuba, Japan | institution |
| NINA | Nano Imaging and Nano Analysis beamline at ESRF: planned | beamline |
| NP | Nano Particle | term |
| NSLS | National Synchrotron Light Source, Brookhaven, New York | synchrotron |
| NSRC | National Synchrotron Research Center, Nakhon Ratchasima, Thailand, jetzt: SLRI | synchrotron |
| NSRL | National Synchrotron Radiation Laboratory, Hefei, China | synchrotron |
| NSRRC | National Synchrotron Radiation Research Center, Hsinchu, Taiwan | synchrotron |
| NZZP | Negatif (phase shift) Zernike Zone Plate | device |
| OCT | Optical Coherent Tomography | method |
| ODF | Orientation Distribution Function | term |
| OPG | Orthopantomogram (panoramic scanning dental X-ray showing a 2D view of a half-circle from ear to ear) | method |
| ORGUES | Organisation of the Users of Soleil | institution |
| OSA | Order Sorting Aperture oder Optical Spectrum Analyser | device |
| OTF | Optical Transfer Function | term |
| PAL | Prism-Array X-ray Lens | device |
| PAL | Pohang Accelerator Laboratory, Pohang, Korea | synchrotron |
| PCI | Phase Contrast Imaging | term |
| PCD | Photon Counting Device | device |
| PCRD | The Pharmaceutical Powder X-ray Diffraction Symposium | Konferenz |
| PCVM | Plasma Chemical Vaporization Machining | method |
| PDS | The Pittsburgh Diffraction Conference | Konferenz |
| PECVD | Plasma Enhanced Chemical Vapour Deposition | method |
| PEEM | Photoelectron Emission Spectroscopy | method |
| PEPICO | Photoelectron-Photoion Coincidence | method |
| PES | Photoemission Spectroscopy | method |
| PETRA | Positron Electron Tandem Ring Accelerator | synchrotron |
| PF | Photon Factory, Tsukuba, Japan | synchrotron |
| PIXE | Particle-Induced X-Ray Emission (or: Proton Induced X-Ray Emission) | method |
| pixel | single image point in 2D imaging; from "picture" and "element" | term |
| PLD | Pulsed Laser Deposition | method |
| PM | Phase Modulator (in phase contrast imaging) | device |
| PMMA | Polymethyl methacrylate, a positive resist better known as acrylic glass | device |
| POLFEL | geplanter Polnischer Freie Elektronen Laser | beamline |
| PolLux | SLS beamline | beamline |
| PRXL | Parabolic Refractive X-ray Lens | device |
| PSD | Power Spectral Density (also: Position Sensitve Device) | term |
| PSF | Point Spread Function | term |
| PSI | Paul Scherrer Institute | institution |
| PSPMT | Position Sensitive Photo-Multiplier Tube | device |
| PSRS | Polish Synchrotron Radiation Society | institution |
| PVD | Physical Vapour Deposition | method |
| PXI | SLS beamline for macromolecular crystallography (at "X06SA") | beamline |
| PXII | SLS beamline for protein crystallography (at "X10SA") | beamline |
| PXIII | SLS beamline for protein crystallography (at "X06DA") | beamline |
| PXM | Projection X-ray Microscopy | method |
| PZZP | Positif (phase shift) Zernike Zone Plate | device |
| QEXAFS | Quick Extended X-ray Absorption Fine Structure | method |
| RADSI | Relative Angle Determinable Stitching Interferometry | method |
| RARAF | Radiological Research Accelerator Facility, Columbia, University of N.Y., USA | institution |
| RAS | Resonant Auger Spectroscopy | method |
| RCI | Rocking Curve Imaging | method |
| RIE | Reactive Ion Etching | method |
| RIXS | Resonant Inelastic X-ray Scattering | method |
| RMS | Root Mean Square | term |
| ROI | Region Of Interest | term |
| ROSAT | Roentgen Satellite | device |
| RPXM | Refractive Prism X-ray Monochromator | device |
| RRCAT | Raja Ramanna Centre for Advanced Technology | institution |
| RSM | Reciprocal Space Mapping | method |
| RSNA | Radiological Society of North America | institution |
| RXMO | Rolled X-ray Mirror Optics | device |
| RXPL | Rolled X-Ray Prism Lens | device |
| RXRR | X-ray Reflectivity | term |
| RZP | Regular Zone Plate | device |
| SARX | Latin American Seminar of Analysis by X-ray Techniques | Konferenz |
| SAS | International Conference on Small-Angle Scattering | Konferenz |
| SAXRD | Skew Angle X-ray Diffraction | method |
| SAXS | Small Angle X-ray Scattering | method |
| SBI | X-ray Speckle-Based phase-contrast Imaging | method |
| SBM | Single Bounce Mirror | device |
| SCD | Single Crystal Diffraction | method |
| sCMOS | scientific CMOS | device |
| SCSS | Compact SASE source at SPring-8 | synchrotron |
| SDD | Silicon Drift Detector | device |
| SDPT | Single Point Diamond Turning | method |
| SEEM | Secondary Electron Emission Microscopy | method |
| SGM | Single Göbel-Mirror | device |
| SHARX | Shack-Hartmann Sensor for Hard X-rays | device |
| SHIM | Scanning Helium Ion Microscope | device |
| SHS | Shack-Hartmann Sensor | device |
| SIE | Spectral Intensity Enhancement | term |
| SIM | SLS beamline for Surfaces / Interfaces Microscopy (at "X11MA") | beamline |
| SIS | SLS beamline for Surface and Interface Spectroscopy (at "X09LA") | beamline |
| SLAC | Stanford Linear Accelerator Center (since Oct 2008 = SLAC National Accelerator Laboratory ) | synchrotron |
| SLDD | Scattering Length Density Difference | term |
| SLRI | Synchrotron Light Research Institute, Nakhon Ratchasima, Thailand | synchrotron |
| SLS | Swiss Light Source, Villigen, Switzerland | synchrotron |
| SOLEIL | SOLEIL Synchrotron, Saint-Aubin, France | synchrotron |
| SoXBIC | Soft X-ray Beam Induced Current | method |
| SPEAR3 | synchrotron light facility at SSRL | institution |
| SPECT | Single Photon Emission Computed Tomography | method |
| SPELEEM | Spectroscopic Photo Emission and Low Energy Electron Microscope (combination of LEEM and spectroscopic imaging) | device |
| SPEM | Spectromicroscopy | method |
| SPES | Slow Photoelectron Spectrocopy | method |
| SPHM | Single-Prism Holographic Microscopy | method |
| SPO | Silicon Pore Optics | device |
| SPring-8 | Super Photon Ring - 8 GeV, Nishi-Harima, Japan | synchrotron |
| SR | Synchrotron Radiation | term |
| SRA | Synchrotron Radiation in Art and Archaeology | Konferenz |
| SRC | Synchrotron Radiation Center, Madison, Wisconsin | synchrotron |
| SRCD | Synchrotron Radiation Circular Dichroism | term |
| SRCL | Synchrotron Radiation Computerized Laminography | method |
| SRL | Saw-tooth Refractive Lens | device |
| SRS | Synchrotron Radiation Source, Daresbury, U. K. | synchrotron |
| SR-STM | Synchrotron Radiation Scanning Tunneling Microscopy | method |
| SRSXTM | Super-Resolution Scanning X-ray Transmission Microscopy | method |
| SRX | Submicron Resolution X-ray Spectroscopy | beamline |
| SRXTM | Synchrotron Radiation based X-ray Tomographic Microscopy | method |
| SSLS | Singapore Synchrotron Light Source, Singapore | synchrotron |
| SSTRC | Siberian Synchrotron Radiation Centre, Novosibirsk, Russia | synchrotron |
| SSRF | Shanghai Synchrotron Radiation Facility, Shanghai | synchrotron |
| SSRL | Stanford Synchrotron Radiation Laboratory, Menlo Park, California | synchrotron |
| STEDM | Stimulated Emission Depleted Microscopy (VIS) | method |
| STXRM | Scanning Transmisison X-Ray-Microscopy | method |
| SU-8 | an X-ray resistant negative resist | device |
| SuperXAS | SLS beamline for XAS (at "X10DA") | beamline |
| SwissFEL | Swiss Free Electron Laser | beamline |
| SXDM | Scanning X-ray Diffraction Microscopy | method |
| SXES | Soft X-ray Emission Spectroscopy | method |
| SXFM | Scanning X-ray Fluorescence Microscopy | method |
| SXM | Scanning X-ray Microscopy | method |
| SXR | Soft X-rays | term |
| SXT | Soft X-ray Telescope | device |
| SXTM | Scanning X-ray Transmission Microscopy | method |
| SXU | Soft X-ray Undulator | device |
| SZP | Spiral Zone Plate | device |
| TAI | Talbot Array Illuminator | device |
| TEDDI | Tomographic Energy-Dispersive Diffraction Imaging | method |
| TER | Total External Reflection | term |
| TGM | Twin Göbel-Mirror | device |
| TIR | Total Internal Reflection | term |
| TLS | Taiwan Light Source | synchrotron |
| TOMCAT | SLS beamline for "TOmographic Microscopy and Coherent rAdiology experimenTs" | beamline |
| TPEPICO | Threshold Photoelectron-Photoion Coincidence | method |
| TPES | Threshold Photoelectron Spectroscopy | method |
| TPS | Taiwan Photon Source | synchrotron |
| TRDS | Total Reflection Double-Slit | device |
| TWINMIC | ELETTRA beamline for multipurpose twin X-ray microscopy ("BL 1.1L") | beamline |
| TXM | Transmission X-ray Microscopy | device |
| TXRF | Total Reflection X-Ray Fluorescence Analysis and Related Methods | Konferenz |
| UGCT | "Centre for X-ray Tomography" at Ghent University | institution |
| UHV | Ultra High Vacuum | term |
| ULX | Ultra-Luminous X-ray source | device |
| UMPA | Unified Modulated Pattern Analysis (in der Röntgenphasenkontrastbildgebung) | method |
| URA | Uniformly Redundant Array (in einem Teleskop mit kodierter Maske) | term |
| USAXS | Ultra Small Angle X-ray Scattering | method |
| UV | Ultraviolet (light) | term |
| UVSOR | Ultraviolet Synchrotron Orbital Radiation Facility, Okazaki, Japan | synchrotron |
| VIS | Visible (light) | term |
| voxel | "volumetric pixel"; the equivalent to the term "pixel" in 2D imaging in 3D imaging | term |
| VSX | VSX Light Source, Kashiwa, Japan | synchrotron |
| VUV | SLS beamline for Vacuum Ultraviolet Radiation (at "X04DB") | beamline |
| WAM | Wide-band All-sky Monitor | device |
| WAXS | Wide-Angle X-ray Scattering | method |
| WG | Wave Guide | device |
| WM | Working Mask (in the LIGA-process) | device |
| XADAR | X-Ray Detection and Ranging | method |
| XAES | X-Ray-Excited Auger Electron Spectroscopy | method |
| XAFS | X-Ray Absorption Fine Structure | method |
| XALOC | ALBA beamline for macromolecular crystallography (= "XALOC - BL13") | beamline |
| XANES | X-ray Absorption Near-Edge Structure | method |
| XANES | X-ray Absorption Near-edge Spectra | method |
| XAS | früher: ALBA beamline for X-ray Absorption Spectroscopy | beamline |
| XAS | X-ray Absorption Spectroscopy | method |
| XEDS | X-Ray Energy Dispersive Spectroscopy | method |
| XES | X-ray Emission Spectroscopy | method |
| XEUS | Planned European X-ray telescope satellite | device |
| XFEL | X-ray Free Electron Laser | device |
| XFH | X-ray Fluorescence Holography | method |
| XFILM | X-ray Full-field Imaging through Lens-based Microdiffraction | method |
| XG | X-ray Grating | device |
| XGI | X-ray Grating Interferometry | method |
| XGS | X-ray Grating Spectrometer | device |
| XIL | SLS beamline for X-ray Interference Lithography | beamline |
| XMCD | ALBA beamline for magnetic dichroism in soft x-ray absorption and resonant scattering (= "BL29 XMCD") | beamline |
| XMCD | X-ray Magnetic Circular Dichroism | Effekt |
| XMLD | X-ray Magnetic Linear Dichroism | Effekt |
| XMM | X-ray Multi Mirror | device |
| XMS | X-ray Microcalorimeter Spectrometer | device |
| XPZL | X-ray Prism Zoom Lens | device |
| XPCS | X-ray Photon Correlation Spectroscopy | method |
| XPD | X-ray Powder Diffraction | method |
| XPD | X-ray Powder Diffraction | beamline |
| X-PEEM | X-ray Photoelectron Emission Microscopy | method |
| XPL | X-ray refractive Prism Lens | device |
| XPS | X-ray Photoelectron Spectroscopy | method |
| XRB | X-ray Background | term |
| XRC | X-ray Crystallography | method |
| XRC | X-ray Contrast | term |
| XRCD | X-Ray Crystal Density | term |
| XRCF | X-Ray Calibration Facility (NASA) | institution |
| XRD | X-ray Diffraction | method |
| XRDA | X-Ray Diffraction Analysis | method |
| XREA | X-Ray Event Analyzer | device |
| XRES | X-Ray Emission Spectroscopy | method |
| XRF | X-ray Fluorescence | method |
| XRFA | X-ray Fluorescence Analysis | method |
| XRFD | X-Ray Fluorescence Densitometry | method |
| XRFS | X-Ray Fluorescence Spectroscopy | method |
| XRG | X-Ray Generator | device |
| XRII | X-Ray Image Intensifier | device |
| XRIM | X-ray reflection imaging microscope | device |
| XRL | X-Ray Laser | device |
| XRL | X-Ray Lithography | method |
| XRM | X-Ray Microscope | device |
| XRM | X-Ray Microscopy | method |
| XRMA | X-Ray Micro-Analysis | method |
| XRMF | X-Ray Micro-Fluorescence | method |
| XRMS | X-ray Resonant Magnetic Scattering; X-Ray Spectroscopy of Magnetic Solids | method |
| XRP | X-Ray Polychromator | device |
| XRPD | X-Ray Powder Diffraction | method |
| XRPL | X-Ray Proximity Lithography | method |
| XRR | X-Ray Reflectometry | method |
| XRS | X-ray Sensor | device |
| XRS | X-Ray Sensitivity | term |
| XRT | X-Ray Telescope | device |
| XRT | X-Ray Topography | method |
| XSA | X-ray Stress Analysis | method |
| XSAD | X-Ray Small Angle Diffraction | method |
| XSAM | X-ray Scanning Analytical Microscope (analytisches Rasterröntgenmikroskop) | device |
| XSM | X-Ray Solar Monitor | device |
| XSPEC | X-Ray Spectrum | term |
| XT | X-ray Tube | device |
| XTA | X-ray Texture Analysis | method |
| XTAL | Crystal | device |
| XTM | X-ray Tomography | method |
| XTS | X-ray Transmission Spectroscopy | method |
| XTT | X-ray tensor tomography | method |
| XVO | X-ray Vortex Optics (gives: spiral phase contrast images) | device |
| XWG | X-ray Wave Guide | device |
| ZD-FZP | Zone-Doubled Fresnel Zone Plate | device |
| ZP | Zone Plate | device |
| ZPCXM | Zernike Phase Contrast X-ray Microscopy | method |
single photon emission computed tomography (SPECT)